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Maryam Beigmohamadi

Scientist
Ernst Ruska-Centre for Microscopy and Spectroscopy with Elec
Ernst Ruska-Centre
Germany

Scientist Materials Science
Biography

Ms. Maryam Beigmohamadi serves as Scientist at Ernst Ruska-Centre. She has expertise in Investigation of silicon based thin layer structures to be used as functional components for future generation solar cells by means of quantitative sub-Ångström high-resolution and scanning transmission electron microscopy techniques..

Research Intrest

Investigation of silicon based thin layer structures to be used as functional components for future generation solar cells by means of quantitative sub-Ångström high-resolution and scanning transmission electron microscopy techniques.

List of Publications
Beigmohamadi, M. (2007). Growth, structure and morphology of organic thin films (No. RWTH-CONV-123912). Fachgruppe Physik.
Farahzadi, A., Beigmohamadi, M., Niyamakom, P., Kremers, S., Meyer, N., Heuken, M., & Wuttig, M. (2010). Characterization of amorphous organic thin films, determination of precise model for spectroscopic ellipsometry measurements. Applied Surface Science, 256(22), 6612-6617.
Mchedlidze, T., Beigmohamadi, M., Berghoff, B., Sohal, R., Suckow, S., Arguirov, T., ... & Kittler, M. (2011). Structural characterization of crystallized Si thin film material by HRTEM and Raman spectroscopy. physica status solidi (a), 208(3), 588-591.
Ding, K., Aeberhard, U., Astakhov, O., Breuer, U., Beigmohamadi, M., Suckow, S., ... & Rau, U. (2012). Defect passivation by hydrogen reincorporation for silicon quantum dots in SiC/SiO x hetero-superlattice. Journal of Non-Crystalline Solids, 358(17), 2145-2149.
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