Kevin Coffey

Professor, MMAE
NanoScience Technology Center and Advanced Materials Process
University of Florida
United States of America

Professor Materials Science

Biography

Kevin Coffey, Ph.D. — Massachusetts Institute of Technology, 1989. His research areas are Thin Film Processing, Magnetic Materials, Solid State Reactions, Nanoscale Tribology Magnetic Thin Films Grain Boundary Diffusion .Dr. Coffey’s research interests include both magnetism and the materials science of nano-scale interfaces.

Research Intrest

Magnetism and the materials science of nano-scale interfaces.

List of Publications

"Determination of optimum Si excess concentration in Er-doped Si-rich SiO2 for optical amplification at 1.54 mu m," O. Savchyn, K. R. Coffey, P. G. Kik, Applied Physics Letters, vol. 97, Article 201107, 2010

"Grain growth and the puzzle of its stagnation in thin Films: A detailed comparison of experiments and simulations", K. Barmak, E. Eggeling, R. Sharp, S. Roberts, T. Shyu, T. Sun, B. Yao, S. Taâ€™san, D. Kinderlehrer, A. Rollett, K. R. Coffey, Materials Science Forum, in press.

"Conical dark field scanning for grain size measurement in thin films", A. Darbal, K. Barmak, D. Choi, X. Liu, T. Sun, B. Yao, A. Warren, K. R. Coffey, Micron, submitted for publication.

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Kevin Coffey

"Determination of optimum Si excess concentration in Er-doped Si-rich SiO2 for optical amplification at 1.54 mu m," O. Savchyn, K. R. Coffey, P. G. Kik, Applied Physics Letters, vol. 97, Article 201107, 2010

"Grain growth and the puzzle of its stagnation in thin Films: A detailed comparison of experiments and simulations", K. Barmak, E. Eggeling, R. Sharp, S. Roberts, T. Shyu, T. Sun, B. Yao, S. Taâ€™san, D. Kinderlehrer, A. Rollett, K. R. Coffey, Materials Science Forum, in press.

"Conical dark field scanning for grain size measurement in thin films", A. Darbal, K. Barmak, D. Choi, X. Liu, T. Sun, B. Yao, A. Warren, K. R. Coffey, Micron, submitted for publication.

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